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NI’s ADAS HIL White Paper is a case study in sensor fusion testing for automotive applications

by Xilinx Employee on ‎08-08-2017 10:44 AM (12,846 Views)

 

A recent White Paper published by National Instruments (NI) and titled “ADAS HIL With Sensor Fusion” discusses the challenges presented by systems that have fused many diverse sensors—and automated driver assistance systems (ADAS) present some of the biggest challenges yet. ADAS systems fuse radar, visible and IR cameras, LIDAR, and ultrasound sensors into an environment sensing system of nearly unprecedented complexity, yet they’re expected to work reliably en masse while installed in consumer-grade automobiles. That’s a stiff challenge indeed.

 

Meeting these challenges requires good design, yes, and it also requies large amounts of testing. Preferably automated testing because there are too many tests to run by hand.

 

This NI White Paper discusses the way that Altran Italia met these challenges by creating an ADAS HIL Test Environment Suite based on NI instruments and the LabVIEW Development Environment that could test a variety of automotive electronics control units (ECUs) including a Sensor Fusion ECU, a Radar ECU, and a camera ECU. The ADAS HIL test system generates 3D video scenes for the cameras and simulates radar-detected objects using an RF simulator that’s based, in part, on one or more NI 2nd-generation PXIe-5840 VSTs (Vector Signal Transceivers), which in turn are based on a Xilinx Virtex-7 690T FPGA. (See “NI launches 2nd-Gen 6.5GHz Vector Signal Transceiver with 5x the instantaneous bandwidth, FPGA programmability.”)

 

 

NI ADAS HIL Test System.jpg

 

ADAS HIL Test Environment

 

 

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About the Author
  • Be sure to join the Xilinx LinkedIn group to get an update for every new Xcell Daily post! ******************** Steve Leibson is the Director of Strategic Marketing and Business Planning at Xilinx. He started as a system design engineer at HP in the early days of desktop computing, then switched to EDA at Cadnetix, and subsequently became a technical editor for EDN Magazine. He's served as Editor in Chief of EDN Magazine, Embedded Developers Journal, and Microprocessor Report. He has extensive experience in computing, microprocessors, microcontrollers, embedded systems design, design IP, EDA, and programmable logic.